Failure Analysis: High Technology Devices
Daniel J. D. Sullivan, Eric J. CarletonThe book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Covers methods and analytical techniques used to find root cause for failures in high technology devices.
Examples from real experiences in failure analysis laboratories.
Descriptions of how to perform the wok with details, not just theory.
Категорії:
Рік:
2022
Мова:
english
Сторінки:
140
ISBN 10:
150152478X
ISBN 13:
9781501524783
Файл:
PDF, 4.33 MB
IPFS:
,
english, 2022